A key breakthrough has been achieved in domestic high-end memory chips. Changxin Memory's self-developed LPDDR6 chip has entered the final stages of R&D verification and is about to enter the mass production phase, breaking the long-term monopoly of overseas giants and enabling it to compete technologically with leading South Korean memory companies.

For the high-precision testing requirements of the LPDDR6-specific 1295Ball POP stacked packaging, Kailidi, leveraging its mature BGA test socket customization capabilities, can provide stable, efficient, and customizable testing solutions for domestic memory chip R&D verification, high and low temperature screening, and ATE mass production testing.

### ? I. Ultra-High Specification Parameter Adaptation

Precisely matches the core parameters of Changxin LPDDR6, supporting a maximum speed of 12800Mbps and a basic SoC collaborative speed of 10667Mbps. Adapts to 16Gb chips and 16GB large-capacity chips for testing, meeting the stringent standards of high-speed signal transmission testing.

### II. 1295Ball High-Density Package Adaptation

Dedicated adaptation for LPDDR6 1295Ball POP stacked packages, overcoming testing challenges such as high-density solder ball alignment deviation and signal crosstalk. Precise probe arrangement matches the array structure, reducing the risk of poor contact in batch testing.

### III. High and Low Temperature Stability Testing Performance

Targeting the stringent verification conditions of memory chips, the test socket possesses excellent high and low temperature tolerance, adapting to new product aging screening and reliability testing, ensuring accurate and stable test data under complex temperature variations.

### IV. Low Power Consumption & RAS Specific Test Optimization

Adapting to the upgraded advantages of LPDDR6's low power consumption and high RAS characteristics, optimized test contact impedance and signal integrity, enabling more accurate capture of new product power consumption and reliability-related test data, adapting to performance verification needs.

### V. Full-Scenario Mass Production Testing Adaptation

Covering the entire process of LPDDR6 R&D verification, sample testing, and ATE mass production testing, supporting customized adaptation, facilitating the rapid deployment of domestically produced memory chips, and improving mass production yield and testing efficiency.

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