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Products
Full-scenario ATE and reliability test solutions, precisely matching chip packaging needs
Test Scene
Chip Application
Total 29 products
ATE(FT/SLT) Test Socket
KLD-ATE/SLT-BGA2352
BGA2532 ATE/SLT测试座
≤30mΩ
Contact R.
500K
Lifespan
Change Kit
KLD-QFN-4x4-8SITE
Custom KLD-QFN-4x4-8SITE
Contact R.
Lifespan
Reliability Test
KLD-LGA72 BI Socket
LGA72 AI uPower Socket
≤50mΩ
Contact R.
≥1000HX5轮
Lifespan
ATE(FT/SLT) Test Socket
KLD-ATE-BGA1024_1.0
BGA1024 ATE Socket
≤50mΩ
Contact R.
500K
Lifespan
Change Kit
定制型KLD-BGA2.9x6.7-8SITE
Custom KLD-BGA2.9x6.7-8SITE
Contact R.
Lifespan
Reliability Test
KLD-IR
Infrared Detector Chip Test Socke
≤50mΩ
Contact R.
30K
Lifespan