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Product Detail

Product Detail

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Reliability Test

KLD-IR

Infrared Detector Chip Test Socket ‖ KLD Technology Adapted for infrared focal plane array and uncooled infrared detector chip R&D and mass production testing ✅Precise customization ✅Ultra-high precision ✅Ultra-high yield ✅Stable and reliable ✅Professional technical service Simultaneously supports optical path and electrical signal transmission, high and low temperature screening, and ATE mass production testing

Package Types
Specifications
Contact Resistance≤50mΩ
Lifespan30K
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