Reliability Test
KLD-IR
Infrared Detector Chip Test Socket ‖ KLD Technology Adapted for infrared focal plane array and uncooled infrared detector chip R&D and mass production testing ✅Precise customization ✅Ultra-high precision ✅Ultra-high yield ✅Stable and reliable ✅Professional technical service Simultaneously supports optical path and electrical signal transmission, high and low temperature screening, and ATE mass production testing
Package Types
Specifications
| Contact Resistance | ≤50mΩ |
| Lifespan | 30K |




