公司新闻

KLD Technology Releases Next-Generation ATE Test System

2024-01-15 KLD Technology 0
image

Product Launch

On January 15, 2024, KLD Technology held a new product launch event at its Shenzhen headquarters, officially introducing the next-generation ATE test system KLD-ATE-1000.

Technical Breakthrough

KLD-ATE-1000 adopts the latest testing technology, achieving ±0.01% test accuracy and supporting 1024 parallel test channels, significantly improving test efficiency.

Market Outlook

The launch of this product will further consolidate KLD Technology's leading position in the semiconductor test equipment field and provide customers with better testing solutions.

半导体ATE