Customized Infrared Detector Test Mount Solution | Solving the Challenges of High and Low Temperature Mass Production Testing for Uncooled Infrared Chips

With the rapid development of infrared imaging, automotive night vision, industrial temperature measurement, and security optoelectronics industries, the requirements for testing accuracy and stability of infrared focal plane array detectors and uncooled infrared detection chips are continuously increasing. These optoelectronic chips often use specialized ceramic or metal packaging and rely on precision array photosensitive structures for operation. This places extremely high demands on the optical path transparency, probe alignment accuracy, and environmental adaptability of the test mount. Ordinary test fixtures are prone to problems such as false tests, poor contact, and low yield.

As a professional semiconductor test mount manufacturer, Kailidi Technology has deep expertise in the optoelectronic chip testing field and has launched a dedicated infrared detector test mount for infrared probe testing scenarios. The product is compatible with various infrared focal plane arrays and optoelectronic detection chips, covering the entire process from R&D verification and high/low temperature screening to ATE mass production testing. Leveraging five core advantages—precise customization, ultra-high precision, ultra-high yield, stable performance, and professional technical services—it can be customized according to the chip packaging structure, array arrangement, and optical testing requirements, balancing optical path transparency and electrical signal transmission, significantly reducing testing errors.

Kailidi consistently provides highly stable test interface solutions to optoelectronic chip design companies and packaging and testing manufacturers, effectively improving the efficiency and yield of infrared chip mass production testing, and providing reliable assurance for the reliability testing of optoelectronic semiconductors.

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Email: jasmine@fcssemi.com
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