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Products
Full-scenario ATE and reliability test solutions, precisely matching chip packaging needs
Test Scene
Chip Application
Total 6 products
ATE(FT/SLT) Test Socket
定制型KLD-QFN32-ATE
Custom KLD-QFN32-ATE
≤50mΩ
Contact R.
300K
Lifespan
ATE(FT/SLT) Test Socket
定制型KLD-QFN24-ATE
Custom KLD-QFN24-ATE
≤50mΩ
Contact R.
300K
Lifespan
ATE(FT/SLT) Test Socket
定制型KLD-QFN48-ATE
Custom KLD-QFN48-ATE
≤50mΩ
Contact R.
300K
Lifespan
ATE(FT/SLT) Test Socket
定制型KLD-QFN76-ATE
Custom KLD-QFN76-ATE
≤50mΩ
Contact R.
300K
Lifespan
ATE(FT/SLT) Test Socket
定制型KLD-光模块-ATE
Custom KLD-光模块-ATE
≤20mΩ
Contact R.
300K
Lifespan
ATE(FT/SLT) Test Socket
定制型KLD-LQFP64-ATE
Custom KLD-LQFP64-ATE
Contact R.
Lifespan