KLD-ATE/SLT-BGA2352
BGA2532 AI Chip Test Socket 1. Coaxial metal design, zero crosstalk 2. PEEK & ceramic materials, million-cycle durability 3. Micron-level pin control, constant resistance Coaxial metal design, zero crosstalk‖PEEK & ceramic materials, million-cycle durability‖Micron-level pin control, constant resistance
| Contact Resistance | ≤30mΩ |
| Lifespan | 500K |
Product Details
Product Details
① Pin Count: 2532 balls, supporting high-density BGA package ATE/SLT testing
② Minimum Pitch: Supports 0.5mm~1.0mm Customized Pitch
③ Bandwidth: >20GHz@-1dB, ensuring high-speed signal transmission integrity
④ Contact Resistance: ≤50mΩ (initial), low resistance ensures test accuracy
⑤ Mechanical Life: 300,000 presses, ensuring mass production continuity
⑥ Operating Temperature: -45°C~+125°C, suitable for automotive-grade three-temperature testing
⑦ Body Material: High-performance engineering plastics such as ceramic/PEEK/Torlon
⑧ Probe Material: Beryllium copper alloy with gold plating, excellent corrosion resistance and conductivity
⑨ Probe Structure: Spring probes can be replaced individually, reducing maintenance costs
⑩ Test Applications: FT mass production testing/SLT system-level testing, suitable for automatic sorting machines
