ATE(FT/SLT) Test Socket
定制型KLD-QFP216-ATE
Shenzhen KLD Technology Co., Ltd. provides professional customization for a full range of ATE test sockets (BGA, QFN, QFP, DFN, LQFP, SOP, etc.), covering package sizes from 6000-pin BGA to micro DFN. With core advantages in high-precision manufacturing, excellent signal integrity, and extended service life, we ensure stable and efficient high-volume manufacturing test for you. Focused on Customization. Dedicated to Reliability.
Package Types
Specifications
| Contact Resistance | ≤50mΩ |
| Lifespan | 300K |
Product Details
In the demanding phase of chip testing, a precise and reliable ATE test socket is the cornerstone for ensuring yield and throughput. We specialize in providing deeply customized solutions for various package types, including standard and irregular BGAs, QFNs, LQFPs, QFPs, and even micro DFNs. Regardless of your chip's pin complexity or signal integrity requirements, we leverage proven engineering expertise to achieve the optimal balance among contact precision, material durability, and high-frequency performance. Our products guarantee not only stable electrical contact every time but also consistent performance under harsh conditions such as high-speed or temperature cycling. This significantly enhances your test throughput and reduces the total cost of test. Choosing us means opting for a trustworthy foundation for your testing success.
